The analysis of thin films introduces numerous unique complexities compared to bulk materials. A thorough knowledge of thin film XRD enables researchers to gain a detailed understanding of their structure and composition and hence, arms them with the knowledge to better predict their in-service behaviour for applications including aerospace, biomedical, corrosion or wear resistance, optical or electronic.
This seminar will take you through the complex analysis of thin films and show you how to generate and interpret thin film XRD data. From specific hardware configurations to experimental design all the way through to data interpretation, Shintaro Kobayashi, a Rigaku Applications Specialist will show you how to gain valuable insights into your thin films using the SmartLab and its unique capabilities such as the in-plane arm and high flux-generated by rotating anode technology.
For more information, please visit www.axt.com.au/thin-film-seminars
RSVP by 10 March 2016 to: Cameron Chai (
[email protected] or 02 9450 1359
