SEMINAR: CMCA Seminar Series: 3D Raman imaging meets AFM, SNOM and profilometry

Knowledge about the morphology and chemical composition of heterogeneous materials on a sub-micrometer scale is crucial for the development of new material properties for highly specified applications. However, each analytical measuring technique has limitations, which may be overcome by their combination. Confocal microscopy has been used to reconstruct three-dimensional images of micro-objects by using a spatial pinhole to eliminate out-of focus light in specimens thicker than the focal plane. Raman spectroscopy on the other hand is able to determine the chemical compositions of materials. The confocal Raman microscope combines Raman spectroscopy with high resolution confocal microscopy. The discrimination of out of focus information used in confocal microscopy is particularly beneficial for confocal Raman imaging since it reduces the volume from which the Raman spectrum is collected. Due to the confocal principle, depth information from transparent materials can be easily obtained, leading to full three dimensional chemical reconstructions of the material’s composition. The combination of confocal Raman microscopy with SPM and true surface microscopy permits characterization of materials at submicron resolution, as well as on mm-rough surfaces across large areas. Examples from various fields of applications will be presented.