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SEMINAR: CMCA Seminar Series: ZEISS Xradia 3D X-ray Microscopes

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Today's date is Sunday, December 15, 2019
CMCA Seminar Series: ZEISS Xradia 3D X-ray Microscopes Other events...
The ZEISS Xradia Versa family and ZEISS Xradia Ultra lab platforms offer a multi-lengthscale solution. State of the art X-ray computed tomography (CT) scanning technology combined with highly specialized, proprietary X-ray optics deliver the highest performance lab-based 3D X-ray microscopes, providing a range of imaging modes from ~30 micron resolution all the way down to 50nm spatial resolution. The Xradia Versa uses patented X-ray detectors and a microscope turret of magnifying objective detectors for easy zooming. Scan mode from 30 micron resolution all the way down to 700 nm spatial resolution. The Xradia Ultra nanoscale X-ray microscope is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50nm

ZEISS Xradia 520 Versa: The flagship product of the award-winning Xradia Versa family provides the most advanced and highest performing non-destructive, 3D imaging and analysis capabilities. Xradia 520 Versa extends the boundaries of non-destructive 3D imaging with advanced contrast tuning capabilities, extensive filtering options, and enhancements delivering greater accuracy and workflow. Xradia 520 Versa frees researchers to push the boundaries of lab-based imaging. With prominent facilities worldwide using non-destructive X-ray microscopy (XRM) to extend the use of valuable samples, the ZEISS Xradia Versa family proves a powerful component of a correlative microscopy solution. Xradia 520 Versa adds a host of innovations to ZEISS Xradia's industry-leading resolution, contrast and powerful advantages for conducting in situ studies under native or controlled conditions. The instrument delivers compositional contrast for better discernment between materials appearing nearly identical, faster time-to-results for time-sensitive applications, and superior ease-of-use for multi-user environments. Xradia Versa solutions are ideal for highly skilled users as well as busy imaging labs with diverse user needs and skillsets. Breakthrough applications for Xradia 520 Versa include compositional contrast in materials science, high aspect ratio tomography for semiconductor failure analysis and 4D studies of material evolution over time. Highlights include advanced contrast tuning capabilities, extensive filtering options, and faster time to results with higher throughput.
Speaker(s) Masako Terada, Applications Engineer, Carl Zeiss X-ray Microscopy
Location CMCA Seminar Room 1.80, Physics Building, Crawley Campus
Contact CMCA Admin <admin-cmca@uwa.edu.au> : 6488 8064
Start Thu, 20 Mar 2014 15:30
End Thu, 20 Mar 2014 17:00
Submitted by CMCA Admin <admin-cmca@uwa.edu.au>
Last Updated Sun, 30 Mar 2014 19:52
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